NDLI: Power driven partial scan

Content Provider	IEEE Xplore Digital Library
Author	Jing-Yang Jou Ming-Chang Nien
Copyright Year	1997
Description	Author affiliation: Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan (Jing-Yang Jou)
Abstract	The power consumption and testability are two of major considerations in modern VLSI design. A full-scan method had been used widely in the past to improve the testability of sequential circuits. Due to the lower overheads incurred, the partial-scan design has gradually become popular. The authors propose a partial scan selection strategy that bases on the structural analysis approach and considers the area and power overheads simultaneously. A powerful sample-and-search algorithm is used to find the solution that minimizes the user-specified cost function in term of power and area overheads. The experimental results show that the sample-and-search algorithm can effectively find the best solution of the specified cost function for almost all circuits, and the saving of overheads on average for each specific cost function is significant.
Starting Page	642
Ending Page	647
File Size	1257967
Page Count	6
File Format	PDF
ISBN	081868206X
ISSN	10636404
DOI	10.1109/ICCD.1997.628933
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1997-10-12
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Cost function Energy consumption Very large scale integration Sequential analysis Sequential circuits
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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