NDLI: A methodology and tool for predictive analysis of configuration bit criticality in SRAM-based FPGAS: Experimental results

Content Provider	IEEE Xplore Digital Library
Author	Ferron, J.B. Anghel, L. Leveugle, R. Bocquillon, A. Miller, F. Mantelet, G.
Copyright Year	2009
Description	Author affiliation: TIMA Laboratory, (Grenoble INP, UJF, CNRS), 46 Avenue Félix Viallet, 38031, FRANCE (Ferron, J.B.; Anghel, L.; Leveugle, R.) \|\| EADS Innovation Works, Natural Radiation Environment, 12, rue Pasteur BP 76, 92152 Suresnes, FRANCE (Bocquillon, A.; Miller, F.) \|\| ATMEL, La Chantrerie, BP70802, 44306 Nantes, FRANCE (Mantelet, G.)
Abstract	The interest for SRAM based FPGAs has increased in the last few years in embedded systems, due to cost and reconfigurability motivations. Such systems may operate in harsh environments with for example ionizing radiations, and the application may require a high level of dependability. When the FPGAs are not developed on radiation-hardened technologies, using them in critical applications requires evaluating the consequences of modifications in their configuration. This paper summarizes an approach to evaluate at design time the criticality of the various bits in the configuration file of such a FPGA. Results are given on an Atmel component and comparisons are made with experimental results based on laser fault injections and proton ground tests.
Starting Page	1
Ending Page	6
File Size	480507
Page Count	6
File Format	PDF
ISBN	9781424443970
DOI	10.1109/ICSCS.2009.5412330
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-06
Publisher Place	Tunisia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Costs Circuits and systems Single event upset Random access memory Circuit faults Fault tolerance Ionizing radiation Space technology SRAM-based FPGA configuration error criticality evaluation Protection Field programmable gate arrays
Content Type	Text
Resource Type	Article

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