NDLI: Partial TMR in FPGAs Using Approximate Logic Circuits

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2015 15th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

Chairman Invitation

Conference Committee

Sponsorship and Support

RADECS 2015 Awards [multiple awards]

List of Reviewers

Table of Contents

A 1 MGy TID Radiation-Tolerant 56 µW CMOS Temperature Sensor with ±1.7°C Accuracy

A Family of Rad-Hard ADC with Flash Architecture

A Fast Neutron Detector Using 10B-Lined Ionization Chamber for Mixed Field Dosimetry

A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing

A MGy, Low-Offset Programmable Instrumentation Amplifier IC for Nuclear Applications

A Mixed Field Facility at CERN for Radiation Test: CHARM

A Radiation-Hardened Non-Redundant Flip-Flop, Stacked Leveling Critical Charge Flip-Flop in a 65 nm Thin BOX FD-SOI Process

Analysis and Detection of Multiple Cell Upsets in SRAM Memories Used as Particle Detectors

Analysis of BOX Layer Thickness on SERs of 65 and 28nm FD-SOI Processes by a Monte-Carlo Based Simulation Tool

Analysis of SRAM-Based FPGA SEU Sensitivity to Combined Effects of Conducted EMI and TID

Analysis Results of In-Flight Measurements in Geostationary and Polar Orbits in 2014-2015

Analyzing the Failure Impact of Using Hard- and Soft-Cores in All Programmable SoC under Neutron-Induced Upsets

Application of Isotope Radiation Sources for Radiation Effects Simulation in Semiconductor Devices

Architectural and Micro-Architectural Techniques for Software Controlled Microprocessor Soft-Error Mitigation

Body Bias Effects on the Single-Event-Transient Response of PDSOI Devices

CARMEN1 and CARMEN2 Experiment: Comparison between In-Flight Measured SEE Rates and Predictions

Cerium Codoping Effect on the Radiation Response of Germanosilicate and Phosphosilicate Multimode Optical Fibers

Comparison of a Readout Chain Dedicated to the Signal Conditioning of a Particle Detector and an Innovative Chain Based on a VCO Concept

Comparison of Irradiation at Low Dose Rate and Irradiation at Elevated Temperature to Reveal ELDRS in Bipolar Linear Circuits

Comparison of the Models of Charged Particle Fluxes in Space

Connection of the Parametric and Functional Control for TID Testing of Complex VLSI Circuits

Correction of In-Flight Dose Sensors Measurements Results in a Middle-Earth Orbit Taking the Fading Effect into Account

Dark Current Spectroscopy on Alpha Irradiated CMOS Image Sensors

Design and SEE Testing of High Density High Speed Radhard Synchronous SRAM

Detailed Geant4 Simulations of the ANITA and ANITA-CUP Neutron Facilities

Different Chips at Identical Marking on the Example of OP1177

Distributed Optical Fiber Radiation Sensing at CERN High Energy AcceleRator Mixed Field Facility (CHARM)

Dose Effects in CMOS Operational Amplifiers with Bipolar and CMOS Input Stage at Different Dose Rates and Temperatures

Dose Effects on CMOS Active Pixel Sensors

Dose Rate Switching Technique to Estimate the Low Dose Rate Response of Bipolar Technologies

Dose-Rate Dependence of Fiber Bragg Gratings' Responses

Dosimetry Inter-Laboratory Comparison between ESTEC, CNA-ALTER/RADLAB, and UCL

Effect of Electron Irradiation on MISFET Integrated Hydrogen Sensors

Elimination of Single Event Latch-Up in the ATMEL ATMX150RHA Rad-Hard CMOS 150nm Cell-Based ASIC Family

Enhanced Low Dose Rate Sensitivity Analysis of Vertical BJT-STMicroelectronics

Evaluation of the Post-Irradiation Temperature Dependence of Operational Amplifier Input Bias Current

Experimental Characterization and In-Flight Observation of Weakened Cell in SDRAM

Experimental Study of 0.18µm and 65nm SRAM SEUs Induced by Heavy Ions, High Energy Protons and Low Energy Protons on Orbits

Experimental Technique for Determination of ELDRS-Free Devices

Features of Radiation Environment Calculation for Spacecrafts Flying on Complex Orbit

Flash-Based FPGA TID and Long-Term Retention Reliability through VT Shift Investigation

Grenoble Large Scale Facilities for Advanced Characterisation of Microelectronics Devices

Heavy-Ion Radiation Impact on a 4Mb FRAM under Different Test Conditions

High Energy (20-60 AMeV) Ion Beam-Line for SEE Testing at U400M FLNR JINR Cyclotron

Identification of Authenticity of Microelectronic Devices Using Radiation Simulation Modeling

Impact of Radiation-Induced Single-Event Transients on High Resolution Time to Digital Converter

Impact of the Border Crossing Effects on the DCNU for Pixels Arrays Irradiated with High Energy Protons

Influence of Neutrons Irradiation on Electrical Traps Existing in GaN-Based Transistors

Investigation of Nonuniform Degradation of CMOS-Sensor Light-Sensitive Surface under Gamma-Irradiation

Investigation of SEGR Cross-Section in Power MOSFETs under Proton Irradiation

Investigation of Single Event Functional Interrupts in Microcontoller with PIC17 Architecture

ISNP/GNEIS Facility in Gatchina for Neutron Testing with Atmospheric-Like Spectrum

Kinetics of Radiation -Induced Optical Losses in Undoped Fiber for Different Temperatures: Experiment and Modeling

Long-Term Transient Radiation Effects in SOI CMOS RF ICs

Magnetic Buncher Accelerator for Radiation Hardness Research and Pulse Detector Characterization

Measurement and Analysis of Multiple Output Transient Propagation in BJT Analog Circuits

Measurement of SET Injected Charge from a Californium-252 Source in 340 nm Straight and Enclosed Layout NMOS and PMOS Transistors

Method of SEU-Hardness Assurance for SRAM with Error Correction Using Focused Laser Sources

MGy Radiation Assessment of a Space-Graded Amplifier and ADC

Modeling Charge Buildup in Deposited Oxides under X-Ray and Gamma Irradiation

Modified Charge Collection Model by Point Node for SEE Sensitivity Estimation

Monte Carlo Tools Accuracy for High Energetic Electron Radiation Environment

Multiple Cell Upset Cross-Section Uncertainty in Nanoscale Memories: Microdosimetric Approach

Multiple Cell Upset Mechanisms in SRAMs

Multiscale Modeling of Accumulation of Radiation Defects in Silicon Detectors under Alpha Particle Irradiation

Neutron-Induced Single Events in a COTS Soft-Error Free SRAM at Low Bias Voltage

New Insight into Heavy Ion Induced SEGR: Impact of Charge Yield

Nonuniform Optical Losses in Laser SEE Tests

On the Characterization of Embedded Memories of Zynq-7000 All Programmable SoC under Single Event Upsets Induced by Heavy Ions and Protons

Optimization of Flexible Ag-Chalcogenide Glass Sensors for Radiation Detection

Partial TMR in FPGAs Using Approximate Logic Circuits

Performance Degradation after Proton Irradiation in Charge-Coupled Devices: A Cross-Device Comparison

Physical Design Methodologies for Soft Error Mitigation Using Redundancy

Physical Mechanisms of Radiation Response in Thick Isolation Oxides for Different Temperatures and Dose Rates

Proton Irradiation Effects on Commercial Laser Diodes

Proton-Induced SDRAM Cell Degradation

Rad-Hard Versions of SPICE MOSFET Models for Effective Simulation of SOI/SOS CMOS Circuits Taking into Account Radiation Effects

Radiation Induced Attenuation Kinetics in Pure-Silica-Core Optical Fibers during Successive Irradiations

Radiation Response of OFDR Distributed Sensors Based on Microstructured Pure Silica Optical Fibers

Radiation Tolerance of Programmable Voltage Supply and High Galvanic Insulation Readout Electronics Used by CERN's LHC Cryogenics

Radiation Vulnerability in 65 nm CMOS I/O Transistors after Exposure to Grad Dose

Radiation-Hardened Gate Array with Embedded SRAM

Raman Based Distributed Fiber Optic Temperature Sensors for Structural Health Monitoring in Radiation Environment

Redundant Skewed Clocking of Pulse-Clocked Latches for Low Power Soft Error Mitigation

Reliability Analysis of Operating Systems for Embedded SoC

Reliability on ARM Processors against Soft Errors by a Purely Software Approach

SEE Laser Testing at Different Temperatures

SEE Test Results of 256k RAM with Preliminary TID Irradiation

SEL Sensitivity Differences in ICs with Same Crystals Marking

Semi-Empirical Method for Estimation of Single-Event Upset Cross-Section for SRAM DICE Cells

Sensitivity to Neutron Radiation of a 45 nm SOI Multi-Core Processor

SiGe HBT TCAD Simulation Taking into Account Impact of Proton Radiation

Simulation and Optimization for Space Low Energy Charged Particle Detector

Simulation of Proton Induced SET in Linear Devices and Assessment of Sensitive Thicknesses

Small-Size High-Performance ARSA Accelerators for On-Line Testing for ECB Radiation Hardness

Statistical Anomalies of Bitflips in SRAMs to Discriminate MCUs from SEUs

TCAD Simulation of Total Ionization Dose Response of 45nm High-K MOSFETs on Bulk Silicon and SOI Substrate

The "Livio Scarsi" X-Ray Facility at University of Palermo for Device Testing

The Critical Elements of the Modern Transceiver ICs upon Space Radiation Exposure

The Effectiveness of Specialized IC Packages: Experimental and Monte-Carlo Simulation for Basic Orbits and Spacecraft Shielding

The Experimental and Simulation Study of Radiation Shielding Properties of Multilayer Shielding Cases with Tantalum Carbide Extender Pigment

The Experimental and Simulation Study of Specialized Thermal Control Coating Application for Radiation Shielding of Electronic Components

The Features of Radiation-Hardening-By-Design of Bulk SRAM Cells

The Impact of Plane-Polarized Unfocused Laser Radiation on Bulk Ionization in Deep-Submicron Modern ICs

The Influence of the 21 MeV Protons on Heterolaser Optical Capacity Based on Gallium-Arsenide with Fiber Resonator

The Issue of Using Test Dose Rate 10 mrad(Si)/s for ELDRS Prediction in MIL-STD-883-H

The Radiation-Hardened Differential Stages and Op Amps without Classical Reference Current Source

The Technique for Estimation of the Chip Temperature of Integrated Circuits during Irradiation

The TID Effects of RRAM Based Oxide Material

TID and SEGR Radiation Characterisation of European COTS Power MOSFETs with Respect to Space Application Electronics

TID Impact on Process Modified CBRAM Cells

TID Response of Various Field Programmable Gate Arrays and Memory Devices

Total Dose and SEE Testing of the Intersil ISL75052SEH Low Dropout Regulator

Total Ionizing Dose and Displacement Damage Effects in a Tunable Laser Diode Based Fiber Optic Sensing System

Total Ionizing Dose Effects in Carbon Nanotube Network Transistors

Total Ionizing Dose Effects in Phase-Locked Loop ICs and Frequency Synthesizers

Typical Facilities and Procedure for Single Event Effects Testing in Roscosmos

Using the FLNR Accelerator Complex for SEE Testing: State of Art and Future Development

UV Single-Photon Absorption Single-Event Transient Testing of Pristine and Irradiated AlGaN/GaN HEMTs

Validation of FDIR Strategy for Spaceborne SRAM-Based FPGAs Using Proton Radiation Testing

Verifying Hardening Techniques for Distributed Electronic Systems in Critical Applications

X-Ray-Induced Upsets in a Xilinx Spartan 3E FPGA

2013 14th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

2011 12th European Conference on Radiation and Its Effects on Components and Systems

2009 European Conference on Radiation and Its Effects on Components and Systems

2008 European Conference on Radiation and Its Effects on Components and Systems

2007 9th European Conference on Radiation and Its Effects on Components and Systems

2005 8th European Conference on Radiation and Its Effects on Components and Systems

Proceedings of the 7th European Conference on Radiation and Its Effects on Components and Systems, 2003. RADECS 2003.

RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605)

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)

RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294)

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems

RADECS 93. Second European Conference on Radiation and its Effects on Components and Systems (Cat. No.93TH0616-3)

RADECS 91 First European Conference on Radiation and its Effects on Devices and Systems

Partial TMR in FPGAs Using Approximate Logic Circuits

Content Provider	IEEE Xplore Digital Library
Author	Sanchez-Clemente, A. Entrena, L. Garcia-Valderas, M.
Copyright Year	2015
Description	Author affiliation: Electron. Technol. Dept., Univ. Carlos III of Madrid, Leganés, Spain (Sanchez-Clemente, A.; Entrena, L.; Garcia-Valderas, M.)
Abstract	TMR is a very effective technique to mitigate SEU effects in FPGAs, but it is often expensive in terms of FPGA resource utilization and power consumption. For certain applications, Partial TMR can be used to trade off the reliability with the cost of mitigation. In this work we propose a new approach to build Partial TMR circuits for FPGAs using approximate logic circuits. This approach is scalable, with a low granularity, and can provide an optimal balance between reliability and overheads. The proposed approach has been validated using fault injection.
Starting Page	1
Ending Page	4
File Size	241790
Page Count	4
File Format	PDF
ISBN	9781509002320
DOI	10.1109/RADECS.2015.7365645
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-09-14
Publisher Place	Russia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Approximation methods Tunneling magnetoresistance Circuit faults Field programmable gate arrays Logic circuits Logic functions Table lookup
Content Type	Text
Resource Type	Article

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