NDLI: Mixed-signal testing using Walsh functions

Content Provider	IEEE Xplore Digital Library
Author	Tchegho, A. Sattler, S. Grab, H.
Copyright Year	2009
Description	Author affiliation: Institute for Electronic Design Automation, Technische Universität München, 80333 Munich, Germany (Sattler, S.) \|\| Department of Analog Design for Test, Infineon Technologies, 85579 Neubiberg, Germany (Tchegho, A.) \|\| Chair of Reliable Circuits and Systems, Friedrich-Alexander-Universität Erlangen-Nürnberg, 91052, Germany (Grab, H.)
Abstract	The paper suggests an accurate and simple approach to frequency testing of analog and mixed-signal circuits in the digital domain. The method is aimed at reducing the cost of test (CoT) for systems-on-chip (SoC) devices while taking advantage of digital resources already present in the SoC devices, and using low-cost digital testers, respectively. It is based on Walsh functions, the Fast Walsh Transformation (FWT) and a simple digital processing algorithm. Since both test signal generation and test response analysis are performed on-chip, it leads to an efficient and robust approach very suitable to built-in self-test (BIST) applications, too. Considerations for on-chip implementation are also addressed together with simulation and experimental results that validate the feasibility of the proposed approach.
Starting Page	1
Ending Page	8
File Size	1183819
Page Count	8
File Format	PDF
ISBN	9781424446186
DOI	10.1109/IMS3TW.2009.5158700
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-06-10
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Performance evaluation System testing Costs Automatic testing Built-in self-test Frequency Signal generators Performance analysis Circuit testing Signal analysis
Content Type	Text
Resource Type	Article

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Mr. Siddhartha Mukherjee siddhartha@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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