NDLI: Automatic test pattern generation for delay defects using timed characteristic functions

Content Provider	IEEE Xplore Digital Library
Author	Shin-Yann Ho Shuo-Ren Lin Ko-Lung Yuan Chien-Yen Kuo Kuan-Yu Liao Jiang, J.-H.R. Chien-Mo Li
Copyright Year	2013
Description	Author affiliation: Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan (Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jiang, J.-H.R.; Chien-Mo Li)
Abstract	Testing integrated circuits under delay defects becomes an essential quality control step in nanometer fabrication technologies, which encounter inevitable process variations. Prior methods on automatic test pattern generation (ATPG) for delay defects, however, are either overly simplified (e.g., timing unaware) or computationally too expensive. This paper proposes a viable ATPG method based on a satisfiability (SAT) formulation using timed characteristic functions (TCFs), which gained notable scalability enhancement very recently. The approach provides a balanced trade-off between accuracy and efficiency. Experimental results show promising runtime and fault coverage improvements over prior SAT-based timing-aware ATPG methods. Moreover, our method provides a nice complement to commercial tools in enhancing test quality.
Sponsorship	IEEE Counc. Electron. Design Autom.
Starting Page	91
Ending Page	98
File Size	936190
Page Count	8
File Format	PDF
ISBN	9781479910717
ISSN	10923152
DOI	10.1109/ICCAD.2013.6691103
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-11-18
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Delays Automatic test pattern generation Logic gates Integrated circuit modeling Clocks
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Software Computer Science Applications

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Automatic test pattern generation for delay defects using timed characteristic functions

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