NDLI: Transient Fault Tolerance on Chip Multiprocessor Based on Dual and Triple Core Redundancy

Content Provider	IEEE Xplore Digital Library
Author	Rui Gong Kui Dai Zhiying Wang
Copyright Year	2008
Description	Author affiliation: Sch. of Comput., Nat. Univ. of Defense Technol., Changsha, China (Rui Gong; Kui Dai; Zhiying Wang)
Abstract	To address the increasing susceptibility of microprocessors to transient faults, many techniques have been proposed to exploit the core redundancy of chip multiprocessors (CMPs). But the inter-core communications become critical in these core redundancy based techniques. To reduce the inter-core communication bandwidth demand, two new approaches, dual core redundancy (DCR) and triple core redundancy (TCR), are proposed for fault tolerance in this paper. In DCR, only store instructions are compared before commit, so that the bandwidth demand can be largely reduced. And the fault recovery is achieved by context saving and recovery. While TCR applies triple modular redundancy (TMR) in the core level to efficiently exploit the core resources of CMPs for transient fault masking. In TCR, only the results of store instructions are compared to detect transient fault and reduce the inter-core communication bandwidth demand. Once detecting a single event upset (SEU), TCR can be reconfigured to execute with the two uncorrupted cores for fault detection.The experimental results demonstrate that compared to traditional transient fault recovery scheme CRTR, both DCR and TCR efficiently reduce inter-core bandwidth demand. DCR achieves transient fault recovery with reasonable performance overhead caused by context saving. TCR occupies more core resources and has the lowest performance overhead during normal execution.
Starting Page	273
Ending Page	280
File Size	330892
Page Count	8
File Format	PDF
ISBN	9780769534480
DOI	10.1109/PRDC.2008.40
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-12-15
Publisher Place	Taiwan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault tolerance Redundancy Yarn Bandwidth Fault detection Cathode ray tubes Single event upset Microprocessors Context Event detection Triple Core Redundancy Transient Fault Tolerance Chip Multiprocessor Dual Core Redundancy
Content Type	Text
Resource Type	Article

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