NDLI: Diagnosis of segment delay defects with current sensing

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2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)

2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

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Diagnosis of segment delay defects with current sensing

Content Provider	IEEE Xplore Digital Library
Author	Aljubouri, W. Somashekar, A.M. Haniotakis, T. Tragoudas, S.
Copyright Year	2014
Description	Author affiliation: ECE Dept., Southern Illinois Univ., Carbondale, IL, USA (Aljubouri, W.; Somashekar, A.M.; Haniotakis, T.; Tragoudas, S.)
Abstract	A novel technique based on the current profile of path segments is presented. Certain current profiles can provide significant insights into the delay characteristics of the segments. They can assist in post-silicon diagnosis for delay defects and also determine shifts in the values of process parameters along the segments. A method to excite such current profiles is presented. Experimental evaluation on benchmark circuits shows the effectiveness of the approach.
Starting Page	122
Ending Page	127
File Size	208577
Page Count	6
File Format	PDF
e-ISBN	9781479961559
DOI	10.1109/DFT.2014.6962101
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2014-10-01
Publisher Place	Netherlands
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Logic gates Delays Current measurement Sensor systems Integrated circuit modeling Layout
Content Type	Text
Resource Type	Article

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