NDLI: Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of Bi$_{4}$Ti$_{3}$O$

Content Provider	SpringerLink
Author	Brown, G.W. Hawley, M.E. Theis, C.D. Yeh, J. Schlom, D.G.
Copyright Year	2000
Abstract	The surface morphology of (0 0 1) Bi$_{4}$Ti$_{3}$O$_{12}$ grown on (0 0 1) SrTiO$_{3}$ by reactive molecular beam epitaxy (MBE) has been examined using atomic force microscopy (AFM). Initial nucleation of a 1/4 unit cell thick layer is followed by growth of 1/2 unit cell thick layers. Between 9 and 16 layers, a transition to 3-dimensional growth occurs, leading to well-defined mounds. This implies a Stranski-Krastonov growth mode. During growth, the morphology follows a behavior consistent with the dynamic scaling hypothesis and we extract values for the scaling exponents α and β from the AFM data. A thickness variation in α is observed and reflects the strain relief associated with the Stranski-Krastonov growth.
Starting Page	351
Ending Page	356
Page Count	6
File Format	PDF
ISSN	13853449
Journal	Journal of Electroceramics
Volume Number	4
Issue Number	2-3
e-ISSN	15738663
Language	English
Publisher	Kluwer Academic Publishers
Publisher Date	2000-01-01
Publisher Place	Boston
Access Restriction	Subscribed
Subject Keyword	Polymer Sciences Optical and Electronic Materials Characterization and Evaluation Materials Ceramics, Glass, Composites, Natural Methods Crystallography
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Ceramics and Composites Mechanics of Materials Materials Chemistry Condensed Matter Physics Electrical and Electronic Engineering

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Atomic Force Microscopy Examination of the Evolution of the Surface Morphology of Bi$_{4}$Ti$_{3}$O$_{12}$ grown by Molecular Beam Epitaxy