NDLI: High sensitivity test signatures for unconventional analog circuit test paradigms

Content Provider	IEEE Xplore Digital Library
Author	Sindia, S. Agrawal, V.D.
Copyright Year	2013
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA (Sindia, S.; Agrawal, V.D.)
Abstract	A method of testing for parametric faults in analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the root mean square (RMS) magnitude of the applied input voltage at a relevant frequency or DC. The test then classifies the CUT as fault-free or faulty based upon a comparison of the estimated polynomial coefficients with those of the fault-free circuit. The test application needs very little augmentation of the circuit to make it testable as only output parameters are used for classification. The method is validated on an active elliptic filter and is shown to uncover parametric faults causing deviations as small as 5% from nominal values. Fault diagnosis based upon sensitivity of polynomial coefficients at relevant frequencies is discussed. Another type of circuit signatures in the form of probability moments of the output when test input is random noise are also proposed. It is shown that the sensitivity of either signature can be enhanced by a newly proposed nonlinear V-transform. Finally, an adaptive test framework leveraging from these signatures and the transform technique is shown to improve defect level and yield loss.
Starting Page	1
Ending Page	10
File Size	714162
Page Count	10
File Format	PDF
ISBN	9781479908592
ISSN	10893539
DOI	10.1109/TEST.2013.6651884
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-09-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit faults Polynomials Hypercubes Sensitivity Mathematical model Transfer functions Fault diagnosis
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Applied Mathematics

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2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Mr. Siddhartha Mukherjee siddhartha@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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