NDLI: Evaluating the effectiveness of detecting delay defects in the slack interval: a simulation study

Content Provider	IEEE Xplore Digital Library
Author	Haihua Yan Singh, A.D.
Copyright Year	2004
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Auburn Univ., AL, USA (Haihua Yan; Singh, A.D.)
Abstract	A new delay testing scheme that identifies abnormal delays in the slack interval by comparing switching delays in neighboring dies on a wafer has been recently proposed and validated on experimental circuits. We evaluate the effectiveness of this new approach through the simulation of injected delay faults in the ISCAS benchmark circuits. The simulations are performed using a simple switched RC (resistor-capacitor) switching delay model. The results indicate that the new delay testing approach is orders of magnitude more effective in detecting and diagnosing smaller delay defects that increase circuit path delays by 10-50%. The new methodology can address increasing concerns that failure to detect such small delay faults during test may be the cause of significant unreliability in emerging nanometer technologies.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council IEEE Philadelphia Sect
Starting Page	242
Ending Page	251
File Size	567543
Page Count	10
File Format	PDF
ISBN	0780385802
DOI	10.1109/TEST.2004.1386958
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-10-26
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Delay effects Circuit testing Timing Circuit faults Production Propagation delay Computational modeling Circuit simulation Electrical fault detection Fault detection
Content Type	Text
Resource Type	Article

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