NDLI: Unsafe board states during PC-based boundary-scan testing

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Unsafe board states during PC-based boundary-scan testing

Content Provider	IEEE Xplore Digital Library
Author	Eklow, B. Sedmak, R. Singletary, D. Vo, T.
Copyright Year	2001
Description	Author affiliation: Cisco Syst. Inc., San Jose, CA, USA (Eklow, B.)
Abstract	Unsafe board states are created when boundary-scan vectors adversely affect non-boundary-scan logic or boundary-scan devices in functional mode. Case studies are provided based on work performed over the last two years, consequences are discussed and solutions are provided.
Sponsorship	IEEE Comput. Soc. Test Technol. Tech. Council
Starting Page	615
Ending Page	623
File Size	796290
Page Count	9
File Format	PDF
ISBN	0780371690
ISSN	10893539
DOI	10.1109/TEST.2001.966681
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-11-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Logic testing Automatic testing System testing Integrated circuit interconnections Logic devices Performance evaluation Printed circuits Backplanes System-on-a-chip
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Applied Mathematics

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