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Content Provider | IEEE Xplore Digital Library |
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Author | Qaddoumi, N. Khousa, M.A. Saleh, W. |
Copyright Year | 2004 |
Description | Author affiliation: Sch. of Eng., American Univ. of Sharjah, United Arab Emirates (Qaddoumi, N.; Khousa, M.A.; Saleh, W.) |
Abstract | Open-ended rectangular waveguides have been used conventionally as imaging probes in the measurement systems developed for near-field microwave nondestructive evaluation (NDE) purposes. These systems have attained an increasing interest as they have proved to be competent in wide spectrum of applications - i.e. imaging of subsurface inclusions in composite structures. The lateral resolution of these probes, and hence the quality of the captured images, is inversely proportional to the electrical area of the waveguide aperture. In order to obtain images of high fidelity for small sized concealed entities, the resolution of the rectangular waveguide probes should be enhanced. In this paper, it will be shown that smoothly tapering the waveguide's aperture in the E-plane significantly improves the spatial resolution of the imaging system. The potential of the proposed probe on the quality of captured images will be demonstrated in real-life NDE problem. Furthermore, the resolution of the new probe will be compared to that of the conventional one. |
Sponsorship | IEEE Instrumentation and Measurement Soc |
Starting Page | 174 |
Ending Page | 177 |
File Size | 330399 |
Page Count | 4 |
File Format | |
ISBN | 078038248X |
ISSN | 10915281 |
DOI | 10.1109/IMTC.2004.1351022 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2004-05-18 |
Publisher Place | Italy |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Microwave imaging Rectangular waveguides Electromagnetic waveguides Probes Apertures Spatial resolution Image resolution Dielectrics High-resolution imaging Nondestructive testing |
Content Type | Text |
Resource Type | Article |
Subject | Instrumentation Electrical and Electronic Engineering |
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