NDLI: Robust Feature Matching for Remote Sensing Image Registration via Locally Linear Transforming

Content Provider	IEEE Xplore Digital Library
Author	Jiayi Ma Huabing Zhou Ji Zhao Yuan Gao Junjun Jiang Jinwen Tian
Copyright Year	1980
Abstract	Feature matching, which refers to establishing reliable correspondence between two sets of features (particularly point features), is a critical prerequisite in feature-based registration. In this paper, we propose a flexible and general algorithm, which is called locally linear transforming (LLT), for both rigid and nonrigid feature matching of remote sensing images. We start by creating a set of putative correspondences based on the feature similarity and then focus on removing outliers from the putative set and estimating the transformation as well. We formulate this as a maximum-likelihood estimation of a Bayesian model with hidden/latent variables indicating whether matches in the putative set are outliers or inliers. To ensure the well-posedness of the problem, we develop a local geometrical constraint that can preserve local structures among neighboring feature points, and it is also robust to a large number of outliers. The problem is solved by using the expectation-maximization algorithm (EM), and the closed-form solutions of both rigid and nonrigid transformations are derived in the maximization step. In the nonrigid case, we model the transformation between images in a reproducing kernel Hilbert space (RKHS), and a sparse approximation is applied to the transformation that reduces the method computation complexity to linearithmic. Extensive experiments on real remote sensing images demonstrate accurate results of LLT, which outperforms current state-of-the-art methods, particularly in the case of severe outliers (even up to 80%).
Sponsorship	IEEE Geoscience and Remote Sensing Society IEEE URSI
Starting Page	6469
Ending Page	6481
Page Count	13
File Size	1863687
File Format	PDF
ISSN	01962892
Volume Number	53
Issue Number	12
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Remote sensing Feature extraction Robustness Image registration Maximum likelihood estimation Noise Distortion remote sensing Feature matching locally linear transforming (LLT) outlier registration
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Earth and Planetary Sciences

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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Mr. Siddhartha Mukherjee siddhartha@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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