NDLI: Intercalibration of Radiation Effects Testing Facilities, and Radiation Damage Measurements: Implied D(E) Accuracy

Content Provider	IEEE Xplore Digital Library
Author	Verbinski, V. V. Cassapakis, C. Pease, R. L. Scott, H. L.
Copyright Year	1963
Abstract	The effectiveness of the neutron displacement cross section DSi(En) in characterizing the radiation damage in silicon was investigated by simultaneous measurements of diverse neutron spectra and of the damage coefficient K resulting from each spectrum. The simultaneous measurements for diverse neutron spectra offer a unique approach to testing DSi(En) with good accuracy because the three essential ingredients are available for the identically same neutron fields: widely varying spectra above the 0.2 MeV radiation-damage threshold in Si, accurate measurements of the neutron spectra ¿(E), and accurate measurements of radiation damage D = K¿. Threshold foil neutron spectrometry measurements were carried out with a standardized technique(12) that combines both activation-foil measurements and neutron transport calculations. The resultant spectra were folded in with Dsi(En) to obtain ¿eq, the equivalent number of near-l MeV neutrons. The values of D = K¿, measured for batches of 2N2222A transistors, were divided by ¿eq to obtain the damage coefficients K for all the neutron fields. The values of K were constant, within 4-5% (one standard deviation) for five basically different neutron fields: TRIGA reactor, FBR-reactor glory hole, and three FBR leakage spectra; free field, polyethylene filtered, and iron filtered. When normalized at the 0.2 MeV Si-damage "threshold", differences of as much as an order of magnitude were observed at higher energies for the last two neutron fields. These differences, extending to energies above 10 MeV, provide essential data with regard to characterizing radiation damage effectiveness via DSi(En) and ¿eq for diverse neutron fields.
Sponsorship	IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD
Starting Page	1629
Ending Page	1633
Page Count	5
File Size	773728
File Format	PDF
ISSN	00189499
Volume Number	25
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1978-12-01
Publisher Place	U.S.A.
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radiation effects Testing Neutrons Inductors Displacement measurement Polyethylene Iron DNA Measurement standards Silicon
Content Type	Text
Resource Type	Article
Subject	Nuclear Energy and Engineering Electrical and Electronic Engineering Nuclear and High Energy Physics

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
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3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Mr. Siddhartha Mukherjee siddhartha@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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