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Author Wright, L. W.
Sponsorship IEEE Reliability Society
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Failure analysis ♦ Space vehicles ♦ System testing ♦ Aerospace electronics ♦ Performance analysis ♦ Propulsion ♦ Laboratories ♦ Qualifications ♦ Feedback
Abstract Failure analysis experience gained in support of several major spacecraft programs has shown the vast majority of electronic part failures encountered to be the result of relatively straightforward quality defects and misuse. Within the framework of this experience, it is estimated that the number of part failures resulting from these simple causes is at least 100 percent greater than that due to more subtle time/environment dependent failure mechanisms. Therefore, even first-order failure analysis without resort to sophisticated facilities and techniques can provide substantial information regarding the cause of equipment malfunction. It is the intent of this paper to briefly discuss the role of part failure analysis in support of system development, indicate the relative proportion of part failures due to various major causes, and present several examples of failure analysis results.
Description Author affiliation :: Jet Propulsion Laboratory, Pasadena, Calif
ISSN 00189529
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1968-03-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number R-17
Issue Number 1
Size (in Bytes) 2.53 MB
Page Count 5
Starting Page 5
Ending Page 9


Source: IEEE Xplore Digital Library