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Author Dharmawansa, P. ♦ Rajatheva, N. ♦ Minn, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1972
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Error probability ♦ Error analysis ♦ Bit error rate ♦ AWGN ♦ Fading ♦ Binary phase shift keying ♦ Additive white noise ♦ Quadrature phase shift keying ♦ OFDM modulation ♦ Performance analysis ♦ Bit error rate (BER), frequency offset, frequency selective fading, orthogonal frequency division multiplexing (OFDM), Rayleigh fading, symbol error rate (SER)
Abstract In this paper, we derive exact closed form bit error rate (BER) or symbol error rate (SER) expressions for orthogonal frequency division multiplexing (OFDM) systems with carrier frequency offset (CFO). We consider the performance of an OFDM system subject to CFO error in additive white Gaussian noise (AWGN), frequency flat and frequency selective Rayleigh fading channels. The BER/ SER performances of BPSK and QPSK modulation schemes are analyzed for AWGN and frequency-flat Rayleigh fading channels while BPSK is considered for frequency-selective Rayleigh fading channels. Our results can easily be reduced to the respective analytical error rate expressions for the OFDM systems without CFO error. Furthermore, the simulation results are provided to verify the accuracy of the new error rate expressions.
Description Author affiliation :: Sch. of Eng. & Technol., Asian Inst. of Technol., Klong Luang
Author affiliation :: Dept. of Electron. & Comput. Eng., Hong Kong Univ. of Sci. & Technol., Hong Kong
Author affiliation :: Dept. of Electr. Eng., Univ. of Texas at Dallas, Richardson, TX
ISSN 00906778
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2009-01-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 57
Issue Number 1
Size (in Bytes) 269.76 kB
Page Count 6
Starting Page 26
Ending Page 31

Source: IEEE Xplore Digital Library