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Author Taylor, B.N.
Sponsorship IEEE Instrumentation and Measurement Society ♦ IEEE Instrumentation and Measurement Society ♦ Bureau international des poids et mesures ♦ IEEE ♦ International Bureau of Weights and Measures (BIPM) ♦ URSI ♦ NBS ♦ Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. ♦ Sci. Council Japan ♦ International Union of Pure and Applied Physics (IUPAP) ♦ Bureau international des poids et mesures ♦ NIST ♦ NRCC ♦ National Conference of Standards Laboratories (NCSL) ♦ Allen Osborne Associates ♦ Andeen-Hagerling, Inc. ♦ Ballantine Lab. Inc. ♦ Clarke-Hess Communications Research Corp. ♦ Fluke Corporation ♦ Guildline Instruments ♦ Hewlett-Packard Co. ♦ Julie Res. Lab. Inc. ♦ Keithley Instruments, Inc. ♦ Measurements International Ltd. Canada ♦ QuadTech Inc. ♦ Quantum Design Inc. ♦ Rotek Instrum. Corp. ♦ Tegam Inc. ♦ Tektronix Inc
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1963
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Electromagnetic measurements ♦ Measurement standards ♦ Optical interferometry ♦ Electrons ♦ Optical resonators ♦ Frequency ♦ Current measurement ♦ Nuclear magnetic resonance ♦ Elementary particle vacuum ♦ Force measurement
Abstract The importance of precision electromagnetic measurements to the fundamental constants, and vice versa is examined. The idea that recent advances in the determination of a number of constants may have made future least-squares adjustments of the constants unnecessary is also discussed. Some of the fundamental constants considered are: the vacuum speed of light, the gas constant, Avogadro's constant, the proton-to-electron mass ratio, and Rydberg's constant for infinite mass.<<ETX>>
Description Author affiliation :: NBS, Gaithersburg, MD, USA
ISSN 00189456
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1989-04-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 38
Issue Number 2
Size (in Bytes) 315.92 kB
Page Count 3
Starting Page 164
Ending Page 166

Source: IEEE Xplore Digital Library