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Author Miftakhutdinov, D. R. ♦ Batrak, D. V. ♦ Bogatov, Alexandr P. ♦ Drakin, A. E. ♦ Plisyuk, S. A.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PLASMA PHYSICS AND FUSION TECHNOLOGY ♦ EMISSION SPECTRA ♦ MICHELSON INTERFEROMETER ♦ PULSATIONS ♦ SEMICONDUCTOR LASERS ♦ SIGNALS ♦ SPECTRAL DENSITY ♦ FUNCTIONS ♦ INTERFEROMETERS ♦ LASERS ♦ MEASURING INSTRUMENTS ♦ SEMICONDUCTOR DEVICES ♦ SOLID STATE LASERS ♦ SPECTRA ♦ SPECTRAL FUNCTIONS
Abstract The degree of time coherence of semiconductor lasers operating in the self-intensity pulsation regime is studied by two methods. In the first method measurements were performed with a Michelson interferometer by recording the autocorrelation function, while in the second (spectral) method the spectral density of emission was measured. It is shown that both methods give similar results; however, the spectral method can understate the degree of coherence by the value up to 30% due to a great contribution of spontaneous emission to a recorded signal. (lasers)
ISSN 10637818
Educational Use Research
Learning Resource Type Article
Publisher Date 2006-08-31
Publisher Place United States
Journal Quantum Electronics
Volume Number 36
Issue Number 8


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