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Author Huang, Tsung-Ching ♦ Cheng, Kwang-Ting Tim ♦ Tseng, Huai-Yuan ♦ Kung, Chen-Pang
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Reliability ♦ Amorphous hydrogenated silicon (a-Si:H) ♦ Flexible electronics ♦ Scan driver ♦ Thin-film transistor ♦ Threshold voltage
Abstract Flexible electronics fabricated on thin-film, lightweight, and bendable substrates (e.g., plastic) have great potential for novel applications in consumer electronics such as flexible displays, e-paper, and smart labels; however, the key elements, namely thin-film transistors (TFTs), for implementing flexible circuits often suffer from electrical instability. Therefore, thorough reliability analysis is critical for flexible circuit design to ensure that the circuit will operate reliably throughout its lifetime. In this article we propose a methodology for reliability simulation of hydrogenated amorphous silicon (a-Si:H) TFT circuits. We show that: (1) the threshold voltage $(V_{TH})$ shift of a single TFT can be estimated by analyzing its operating conditions; and (2) the circuit lifetime can be predicted accordingly by using SPICE-like simulators with proper modeling. We also propose an algorithm to reduce the simulation time by orders of magnitude, with good prediction accuracy. To validate our analytical model and simulation methodology, we compare simulation results with the actual circuit measurements of an integrated a-Si:H TFT scan driver fabricated on a glass substrate and we demonstrate very good consistency.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-08-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 4
Issue Number 3
Page Count 23
Starting Page 1
Ending Page 23


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Source: ACM Digital Library