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Author Karthick, P. ♦ Divya, V. ♦ Sridharan, M. ♦ Jeyadheepan, K.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ CONCENTRATION RATIO ♦ DOPED MATERIALS ♦ ELECTRICAL PROPERTIES ♦ ETHANOL ♦ EV RANGE ♦ FIELD EMISSION ♦ FLUORINE ♦ GLASS ♦ GRAIN ORIENTATION ♦ GRAIN SIZE ♦ MOBILITY ♦ OPACITY ♦ POLYCRYSTALS ♦ PYROLYSIS ♦ SCANNING ELECTRON MICROSCOPY ♦ SOLVENTS ♦ SUBSTRATES ♦ THIN FILMS ♦ TIN OXIDES ♦ X-RAY DIFFRACTION
Abstract Fluorine doped tin oxide (FTO) thin films were deposited on to the well cleaned microscopic glass substrates using nebulized-spray pyrolysis (n-SP) technique by varying the water to ethanol solvent proportion. The deposited thin films were characterized by X-ray diffraction (XRD), UV-Vis-NIR spectroscopy, field emission scanning electron microscopy and Hall measurements to study the structural, optical, surface morphological and electrical properties of the films, respectively. Results of the analyzes show that the films are polycrystalline, having tetragonal structure with the preferred orientation along (110) plane. The grain size varies between 7 to 20 nm. The optimized films exhibit the optical transparency of 85 % at the wavelength of 580 nm. The optical bandgap lies in the range of 3.94 to 4 eV. The optimized films, deposited with 40 % of ethanol proportion are having the mean resistivity 4.72×10{sup −3} Ω-cm, carrier concentration 1.79×10{sup 20} cm{sup 3} and the mobility 7 cm{sup 2}/Vs.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-06-24
Publisher Place United States
Volume Number 1665
Issue Number 1


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