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Author Roshchin, I.V. ♦ Stepankin, V.N. ♦ Kuznetsov, A.V.
Sponsorship Council on Superconductivity ♦ Appl. Superconductivity Conference Inc ♦ MIT
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Critical current ♦ Grain boundaries ♦ Josephson junctions ♦ Superconductivity ♦ Temperature dependence ♦ Bismuth ♦ Biological materials ♦ Current measurement ♦ Microwave measurements ♦ Electric variables measurement
Abstract Critical current and electrical transport properties of single grain boundaries in bulk bicrystals of the copperless oxide superconductors BaPb/sub 1-x/Bi/sub x/O/sub 3/ and Ba/sub 1-x/K/sub x/BiO/sub 3/ were measured in order to investigate quasiparticle tunneling and Josephson properties of these materials, which hold promise for the creation of low temperature microwave electronics and cryogenic particle detectors. An unusual and remarkable feature of the temperature dependencies of critical current is the non-monotonous behavior with sharp maximum at temperatures well below the critical temperature. This anomalous low temperature re-entrant behavior appears to be a new universal feature of single grain boundaries in copperless oxide superconductors. Our studies of grain boundary transport properties in BaPb/sub 1-x/Bi/sub x/O/sub 3/ and Ba/sub 1-x/K/sub x/BiO/sub 3/ bicrystals lead us to the conclusion that re-entrant behavior of critical current originates from changes in oxygen electronic states due to heterovalent substitution in copperless materials.<<ETX>>
Description Author affiliation :: Illinois Univ., Champaign, IL, USA
ISSN 10518223
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-06-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 5
Issue Number 2
Size (in Bytes) 292.98 kB
Page Count 3
Starting Page 1328
Ending Page 1330


Source: IEEE Xplore Digital Library