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Author Wang, Shuo ♦ Dai, Jianwei ♦ Wang, Lei
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Nanowire crossbar ♦ Defect tolerance ♦ Memory ♦ Reliability
Abstract Nano/molecular technologies have emerged as the potential fabrics for building future integrated systems. However, due to the imperfect fabrication process, these extremely scaled devices are vulnerable to a large number of defects and transient faults. Memory systems, which are the primary application targeted by these technologies, are particularly exposed to this problem due to the ultra-high integration density and elevated error sensitivity. In this article, we propose a defect-tolerant technique, referred to as hybrid redundancy allocation, for the design of molecular crossbar memory systems. By using soft redundancy (runtime exploitation of memory spatial/temporal locality) in combination with hardware redundancy (spare memory cells), the proposed technique can achieve better error management at a low cost as compared with conventional techniques. Simulation results demonstrate the significant improvement in defect tolerance, efficiency, and scalability of the proposed technique.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-02-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 9
Issue Number 1
Page Count 18
Starting Page 1
Ending Page 18

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Source: ACM Digital Library