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Author Wagner, Ryan ♦ Killgore, Jason P.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ ATOMIC FORCE MICROSCOPY ♦ EXCITATION ♦ FREQUENCY RANGE ♦ MECHANICAL PROPERTIES ♦ MODULATION ♦ PIEZOELECTRICITY ♦ POLYMERS ♦ RESONANCE
Abstract We demonstrate photothermally excited force modulation microscopy (PTE FMM) for mechanical property characterization across a broad frequency range with an atomic force microscope (AFM). Photothermal excitation allows for an AFM cantilever driving force that varies smoothly as a function of drive frequency, thus avoiding the problem of spurious resonant vibrations that hinder piezoelectric excitation schemes. A complication of PTE FMM is that the sub-resonance cantilever vibration shape is fundamentally different compared to piezoelectric excitation. By directly measuring the vibrational shape of the cantilever, we show that PTE FMM is an accurate nanomechanical characterization method. PTE FMM is a pathway towards the characterization of frequency sensitive specimens such as polymers and biomaterials with frequency range limited only by the resonance frequency of the cantilever and the low frequency limit of the AFM.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-11-16
Publisher Place United States
Journal Applied Physics Letters
Volume Number 107
Issue Number 20


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