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Author Yang, Shengqi ♦ Wang, Wenping ♦ Hagan, Mark ♦ Zhang, Wei ♦ Gupta, Pallav ♦ Cao, Yu
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2013
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Negative bias temperature instability ♦ Circuit aging and reliability ♦ Computer-aided design ♦ Node criticality computation ♦ Timing analysis and optimization
Abstract For sub-65nm technology nodes, Negative Bias Temperature Instability (NBTI) has become a primary limiting factor of circuit lifetime. During the past few years, researchers have spent considerable effort on accurate modeling and characterization of circuit delay degradation caused by NBTI at different design levels. The search for techniques and methodologies which can aid in effectively minimizing the NBTI effect on circuit delay is still underway. In this work, we present the usage of node criticality computation to drive NBTI-aware timing analysis and optimization. Circuits that have undergone this optimization flow show strong resistance to NBTI delay degradation. For the first time, this work proposes a node criticality computation algorithm under an NBTI-aware timing analysis and optimization framework. Our work provides answers to the following yet unaddressed questions: (a) what is the definition of node criticality in a circuit under the NBTI effect? (b) how do we identify the critical nodes that, once protected, will be immune to NBTI timing degradation? and (c) what are the NBTI effect attenuation approaches? Experimental results indicate that by protecting the critical nodes found by our proposed methodology, circuit delay degradation can be reduced by up to 50%. Combined with peak temperature reduction, the delay degradation can be be further improved.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2013-10-08
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 9
Issue Number 3
Page Count 19
Starting Page 1
Ending Page 19


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Source: ACM Digital Library