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Author Lu, H. X. ♦ Zhang, J. ♦ Zhang, H. R. ♦ Li, Y. ♦ Chen, Y. S. ♦ Shen, B. G. ♦ Sun, J. R.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ ATOMIC FORCE MICROSCOPY ♦ ELECTRIC POTENTIAL ♦ FILMS ♦ IMAGES ♦ INTERFACES ♦ LAYERS ♦ MAPPING ♦ SCHOTTKY BARRIER DIODES ♦ STRONTIUM TITANATES
Abstract Basing on conductive atomic force microscopy, we presented a direct conductance mapping for the interface of the La{sub 0.67}Sr{sub 0.33}MnO{sub 3}/Nb:SrTiO{sub 3} hetero-junction. The most remarkable observation is the presence of an interfacial layer in Nb:SrTiO{sub 3} adjacent to the manganite film. Within this layer, the AFM tip/Nb:SrTiO{sub 3} contact shows a current-voltage dependence that strongly deviates from Shockley equation, unlike a Schottky diode. Spatial extension of this layer is explored and possible transport mechanism in or outside this interfacial layer is discussed. The present work gives a direct intuitional image on the interface of manganite junction. The principle proven here can be extended to other complex oxide interfaces.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2016-02-01
Publisher Place United States
Journal Applied Physics Letters
Volume Number 108
Issue Number 5


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