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Author Popa, A. ♦ Toloman, D. ♦ Stan, M. ♦ Silipas, T. D. ♦ Biris, A. R.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY ♦ MATERIALS SCIENCE ♦ CHROMIUM ADDITIONS ♦ CHROMIUM IONS ♦ CHROMIUM OXIDES ♦ CONCENTRATION RATIO ♦ DOPED MATERIALS ♦ ELECTRON SPIN RESONANCE ♦ GALLIUM IONS ♦ GALLIUM OXIDES ♦ NANOPARTICLES ♦ RAMAN SPECTROSCOPY ♦ ULTRAVIOLET SPECTRA ♦ VALENCE ♦ X-RAY DIFFRACTION
Abstract In the present work we report the experimental results obtained on Ga{sub 2}O{sub 3} nanoparticles doped with Cr ions. X-ray diffraction analysis confirms the substitution of Ga ions with Cr ions. A secondary phase of Cr{sub 2}O{sub 5} oxides was evidence at high doping Cr concentration by Raman spectroscopy. Different valence state of Cr ions was highlighted by UV-VIS spectroscopy. EPR spectroscopy data show the presence of different environments for Cr ions, depending on the Cr addition.
ISSN 0094243X
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-12-23
Publisher Place United States
Volume Number 1700
Issue Number 1


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