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Author Minami, Yasuo ♦ Horiuchi, Kohei ♦ Masuda, Kaisei ♦ Takeda, Jun ♦ Katayama, Ikufumi
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ CARRIERS ♦ DAMPING ♦ DETECTION ♦ DIELECTRIC MATERIALS ♦ LANGMUIR FREQUENCY ♦ PERMITTIVITY ♦ PLATES ♦ PULSES ♦ PUMPS ♦ SPECTROSCOPY
Abstract We have demonstrated accurate observations of terahertz (THz) dielectric response due to photoexcited carriers in a Si plate via single-shot optical-pump and THz-probe spectroscopy. In contrast to conventional THz time-domain spectroscopy, this spectroscopic technique allows single-shot detection of the THz response of materials at a given delay time between the pump and THz pulses, thereby sufficiently extending the time interval between the pump pulses. As a result, we can accurately measure the dielectric properties of materials, while avoiding artifacts in the response caused by the accumulation of long-lived photoexcited carriers. Using our single-shot scheme, the transmittance of a Si plate was measured in the range of 0.5–2.5 THz with different pump fluences. Based on a Drude model analysis, the optically induced complex dielectric constant, plasma frequency, and damping rate in the THz region were quantitatively evaluated.
ISSN 00036951
Educational Use Research
Learning Resource Type Article
Publisher Date 2015-10-26
Publisher Place United States
Journal Applied Physics Letters
Volume Number 107
Issue Number 17


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