Access Restriction

Author Davids, Daniel ♦ Datta, Siddhartha ♦ Mukherjee, Arindam ♦ Joshi, Bharat ♦ Ravindran, Arun
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Microfluidic biochip ♦ Droplet flooding ♦ Faults tolerance ♦ Multiple fault ♦ Testing
Abstract Microfluidics-based biochips consist of microfluidic arrays on rigid substrates through which, movement of fluids is tightly controlled to facilitate biological reactions. Biochips are soon expected to revolutionize biosensing, clinical diagnostics, and drug discovery. Critical to the deployment of biochips in such diverse areas is the dependability of these systems. Thus, robust testing techniques are required to ensure an adequate level of system dependability. Due to the underlying mixed technology and energy domains, such biochips exhibit unique failure mechanisms and defects. In this article we present a highly effective fault diagnosis strategy that uses a single source and sink to detect and locate multiple faults in a microfluidic array, without flooding the array, a problem that has hampered realistic implementations of all existing strategies. The strategy renders itself well for a built-in self-test that could drastically reduce the operating cost of microfluidic biochips. It can be used during both the manufacturing phase of the biochip, as well as field operation. Furthermore, the algorithm can pinpoint the actual fault, as opposed to merely the faulty regions that are typically identified by strategies proposed in the literature. Also, analytical results suggest that it is an effective strategy that can be used to design highly dependable biochip systems.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-10-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 2
Issue Number 4
Page Count 15
Starting Page 262
Ending Page 276

Open content in new tab

   Open content in new tab
Source: ACM Digital Library