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Author Thompson, A. ♦ Chapman, K. C.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword PARTICLE ACCELERATORS ♦ INSTRUMENTATION, INCLUDING NUCLEAR AND PARTICLE DETECTORS ♦ ADVANCED LIGHT SOURCE ♦ USES ♦ ELEMENTS ♦ X-RAY FLUORESCENCE ANALYSIS ♦ SYNCHROTRON RADIATION ♦ MIRRORS ♦ QUANTITATIVE CHEMICAL ANALYSIS ♦ TRACE AMOUNTS ♦ GEV RANGE 01-10
Abstract The fluorescence microprobe beamline at the Advanced Light Source (ALS) is a unique instrument for analysis of trace elements. The beamline is on a bending magnet port of the synchrotron and uses a pair of multilayer-coated mirrors to focus the x-ray source to a spot size of 1{endash}5 {mu}m{sup 2}. Since the multilayer mirrors limit the energy bandpass of the system to 5{endash}10{percent}, the trace element sensitivity is significantly improved compared to the use of grazing incidence mirrors. Different pairs of mirrors have been used to operate at 8.5, 10, and 12.5 keV. The detection limits for elements from Si to As will be presented for operation at both 1.5 GeV and 1.9 GeV. Results that illustrate the features of the instrument will be presented from the many samples that have been studies. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00346748
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-09-01
Publisher Place United States
Journal Review of Scientific Instruments
Volume Number 67
Issue Number 9
Technical Publication No. CONF-9510119-


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