Thumbnail
Access Restriction
Open

Author Huang, S. ♦ Ming, Z. H. ♦ Soo, Y. L. ♦ Kao, Y. H. ♦ Tanaka, M. ♦ Munekata, H.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ GALLIUM ARSENIDES ♦ HETEROJUNCTIONS ♦ MANGANESE ALLOYS ♦ COORDINATION NUMBER ♦ CRYSTAL STRUCTURE ♦ INTERFACES ♦ MAGNETIC MATERIALS ♦ MICROSTRUCTURE ♦ MOLECULAR BEAM EPITAXY ♦ THIN FILMS ♦ X-RAY DIFFRACTION ♦ EXAFS ♦ INTERFACE STRUCTURE
Abstract Ferromagnetic MnAs thin films grown on GaAs (001) substrates by molecular-beam epitaxy have been studied by the methods of grazing incidence x-ray scattering, x-ray diffraction, and extended x-ray-absorption fine structure. Microstructures in two films prepared with different first-layer growth conditions (template effects) are compared in terms of the interfacial roughness in the layer structure, lattice constants, epilayer thickness, local environment surrounding the Mn atoms, coordination number, and local disorder. Our results indicate that the template effects can cause significant differences in the local structures and crystallinity of the MnAs epitaxial layers. {copyright} {ital 1996 American Institute of Physics.}
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 1996-02-01
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 79
Issue Number 3


Open content in new tab

   Open content in new tab