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Author Takahashi, Kunio ♦ Kajihara, Hideaki ♦ Urago, Masataka ♦ Saito, Shigeki ♦ Mochimaru, Yoshihiro ♦ Onzawa, Tadao
Sponsorship (US)
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Publisher The American Physical Society
Language English
Subject Keyword CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS ♦ ADHESION ♦ AXIAL SYMMETRY ♦ BOUNDARY ELEMENT METHOD ♦ EMPLOYMENT ♦ MANIPULATORS ♦ PHYSICS ♦ SHAPE ♦ SUBSTRATES
Abstract An adhered particle can be detached by Coulomb interaction. The voltage required for detachment for micromanipulation is theoretically analyzed by employment of a boundary element method. The system consists of a manipulating probe, a spherical particle, and a substrate plate, all of these objects being conductive. The manipulator and the substrate are cylindrical, and axial symmetry is assumed. Although a numerical method is used to solve the equations, all parameters are normalized. The effect of the shape parameters on the Coulomb force is systematically calculated. The force is independent of system size and depends on the relative shape of the system. The force is proportional to the applied voltage raised to the second power. The force generated by the Coulomb interaction is compared with the adhesion force deduced from the Johnson{endash}Kendall{endash}Roberts theory, and the voltage required for detachment is clearly expressed. The possibilities and limitations of micromanipulation using both the adhesion phenomenon and Coulomb interaction are theoretically discussed. {copyright} 2001 American Institute of Physics.
ISSN 00218979
Educational Use Research
Learning Resource Type Article
Publisher Date 2001-07-01
Publisher Place United States
Journal Journal of Applied Physics
Volume Number 90
Issue Number 1


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