Thumbnail
Access Restriction
Subscribed

Author Mittal, Sparsh
Source ACM Digital Library
Content type Text
Publisher Association for Computing Machinery (ACM)
File Format PDF
Copyright Year ©2015
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Review ♦ Cache ♦ Classification ♦ Hard-error ♦ Low-voltage ♦ Memory ♦ Near-threshold voltage computing (NT) (NTV) (NTC) ♦ Reliability ♦ Voltage scaling
Abstract Energy efficiency has now become the primary obstacle in scaling the performance of all classes of computing systems. Low-voltage computing, specifically, near-threshold voltage computing (NTC), which involves operating the transistor very close to and yet above its threshold voltage, holds the promise of providing many-fold improvement in energy efficiency. However, use of NTC also presents several challenges such as increased parametric variation, failure rate, and performance loss. This article surveys several recent techniques that aim to offset these challenges for fully leveraging the potential of NTC. By classifying these techniques along several dimensions, we also highlight their similarities and differences. It is hoped that this article will provide insights into state-of-the-art NTC techniques to researchers and system designers and inspire further research in this field.
ISSN 15504832
Age Range 18 to 22 years ♦ above 22 year
Educational Use Research
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2015-12-01
Publisher Place New York
e-ISSN 15504840
Journal ACM Journal on Emerging Technologies in Computing Systems (JETC)
Volume Number 12
Issue Number 4
Page Count 26
Starting Page 1
Ending Page 26


Open content in new tab

   Open content in new tab
Source: ACM Digital Library