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Author Bhattacharya, B.B. ♦ Dmitriev, A. ♦ Gossel, M.
Sponsorship IEEE Computer Society Technical Committee on Distributed Process ♦ IEEE Computer Society Technical Committee on VLSI ♦ IEEE Technical Committee on Computer Architecture ♦ IEEE Computer Society
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1968
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Fault diagnosis
Abstract A structure-independent method for space compaction in combinational circuits based on a new generic scheme is presented. It is shown that a single-output compactor can always be designed for compressing test responses of a circuit-under-test (CUT) with guaranteed zero-aliasing. Test responses from multiple outputs are compacted to a single periodic data stream. The compactor is independent of the fault model and can be designed only from the knowledge of the given test set and the corresponding fault-free responses. An additional response logic and a special code checker are used to design the compactor. The same test set given for the CUT also detects all multiple stuck-at faults in the response logic and almost all faults in the rest of the compactor. Further, time compaction is also easily achieved. Since the design can be accomplished without any information about the structure and functionality of the CUT, it would be useful for testing embedded cores as their internal structures may not be transparent to the users.
Description Author affiliation :: ACM Unit, Indian Stat. Inst., Calcutta, India
ISSN 00189340
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2003-12-01
Publisher Place U.S.A.
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Volume Number 52
Issue Number 12
Size (in Bytes) 191.67 kB
Page Count 6
Starting Page 1646
Ending Page 1651

Source: IEEE Xplore Digital Library