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Author Shaposhnikov, A. N. ♦ Prokopov, A. R. ♦ Berzhansky, V. N. ♦ Karavainikov, A. V. ♦ Vysokikh, Yu. E. ♦ Gerasimenko, N. N. ♦ Smirnov, D. I.
Source United States Department of Energy Office of Scientific and Technical Information
Content type Text
Language English
Subject Keyword MATERIALS SCIENCE ♦ ANNEALING ♦ ATOMIC FORCE MICROSCOPY ♦ CRYSTAL LATTICES ♦ CRYSTALLIZATION ♦ FARADAY EFFECT ♦ FILMS ♦ ION BEAMS ♦ SPUTTERING ♦ SUBSTRATES ♦ X-RAY DIFFRACTION
Abstract Highlights: • The dependences of properties of (Bi,Ga):DyIG films on GGG and CMZGGG substrates on the time of crystallization annealing were studied. • It was found that the films properties depend substantially on the substrate type and the time of crystallization annealing. • A minimal time of annealing to achieve the optimal parameters of the film was determined. - Abstract: The dependences of magneto-optical, structural and morphological properties of reactive ion beam sputtered (RIBS) nanoscale (Bi,Ga)-substituted DyIG [(Bi,Ga:DyIG)] films on (111) GGG and (111) CMZGGG substrates on the time of crystallization annealing were studied using Faraday effect measurements, X-ray diffraction and scanning atomic force microscopy. It was found that the roughness, degree of crystallinity and Faraday rotation angle of the films depend substantially on the substrate type and the time of crystallization annealing. It was determined a minimal time to achieve the optimal ratio between the measured magneto-optical and structural parameters of the film.
ISSN 00255408
Educational Use Research
Learning Resource Type Article
Publisher Date 2017-11-15
Publisher Place United States
Journal Materials Research Bulletin
Volume Number 95


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