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Author Mazack, L.J.
Sponsorship IEEE Syst., Man & Cybernetics Soc
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2002
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods
Subject Keyword Stochastic processes ♦ Measurement uncertainty ♦ Computer science ♦ Logic ♦ Shape ♦ Linearity ♦ Probability distribution ♦ Fuzzy sets
Abstract The paper is an initial exploration of representation, uncertain precision, and dependency as a connected concern that is not easily decomposed. Often for reasons of computational simplicity, the assumption is made that attributes are independent of each other. Similarly, whether dependency exists is classically expressed in terms of first order logic. The actuality is that often the assumptions produce results that are not good representations of reality. An integrated representation of multiple, related attributes is difficult. Usually, different attributes have different ranges and linearity. Sometimes, normalization is a first step in meaningfully representing different kinds of data, or, as a first step to the combination different kinds of data. Most values are not crisply known. A method of dependency representation is needed. The issue of how to represent both dependency and uncertainty needs to be resolved. In a very real sense, dependency representations and their imprecision both enriches and constrains how we approach the solutions to our problems.
Description Author affiliation: Dept. of Comput. Sci., Cincinnati Univ., OH, USA (Mazack, L.J.)
ISBN 0780374614
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2002-06-27
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 576.67 kB
Page Count 6
Starting Page 445
Ending Page 450


Source: IEEE Xplore Digital Library