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Author Michel, C. ♦ Reinosa, R.D.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council ♦ IEEE Philadelphia Sect
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2004
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Costs ♦ Technological innovation ♦ Electronic equipment testing ♦ Principal component analysis ♦ Surface-mount technology ♦ Electronics packaging ♦ Inspection ♦ Manufacturing processes ♦ Milling machines ♦ Feedback
Abstract The selection of an adequate set of test and inspection techniques to verify the quality and functionality of a product, as well as, the integrity of the manufacturing process can be a complex task. This selection process normally require a detailed technical assessment on the effectiveness of each test technique, trade-off analysis among alternate test techniques/platforms and an economic evaluation of the various options available. In industry today, there are many methodologies utilized to derive the return-on-investment (ROI) analysis of a particular manufacturing test strategy. The test strategy cost model of the National Electronics Manufacturing Initiative, Inc. (NEMI) completed, in April 2003, has been enhanced based on the feedback received from users of the model and on experiences of the authors when applying this model to analyze current product test strategies.
Description Author affiliation: Hewlett-Packard Co., Guadalajara, Mexico (Michel, C.)
ISBN 0780385802
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2004-10-26
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 491.52 kB
Page Count 9
Starting Page 384
Ending Page 392


Source: IEEE Xplore Digital Library