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Author Rusli, J.R. ♦ Sidek, R.M. ♦ Zuha, W.H.W.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2012
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics ♦ Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Testing ♦ Random access memory ♦ Databases ♦ Algorithm design and analysis ♦ Generators ♦ Circuit faults ♦ Graphical user interfaces ♦ memory fault syndrome ♦ SRAM ♦ NPSF ♦ ANPSFSG ♦ GUI ♦ March Algorithm ♦ memory diagnosis ♦ memory testing
Abstract With the increasing complexity of memory devices, fault diagnosis is becoming as important as fault detection. Fault diagnosis is to locate and identify type of fault. One of the memory faults is Neighborhood Pattern Sensitive Faults (NPSF) which is one of the faults that are hard to test due to higher number of cells to be tested at one time. To improve the process of analyzing NPSF detection and to generate the fault syndrome for NPSF diagnosis, an Automated NPSF Syndrome Generator (ANPSFSG) is developed. A proven March algorithms are used in this generator to verify the efficiency of this generator by producing the fault coverage and diagnostic resolution. A user-friendly Graphical User Interface (GUI) of ANPSFSG is also developed by using Microsoft Visual Basic software to load the algorithm under test and display the results.
Description Author affiliation: Department of Electronics; Universiti Kuala Lumpur British Malaysia Institute Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia (Rusli, J.R.) || Department of Electrical and Electronic Engineering, Universiti Putra Malaysia, 43400 UPM Serdang, Selangor, Malaysia (Sidek, R.M.; Zuha, W.H.W.)
ISBN 9781467323956
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2012-09-19
Publisher Place Malaysia
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781467323963
Size (in Bytes) 1.05 MB
Page Count 4
Starting Page 482
Ending Page 485


Source: IEEE Xplore Digital Library