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Author Uehara, H. ♦ Kudo, K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1998
Language English
Subject Domain (in DDC) Natural sciences & mathematics ♦ Physics ♦ Electricity & electronics
Subject Keyword Fractals ♦ Trees - insulation ♦ Electrodes ♦ Voltage ♦ Needles ♦ Pattern analysis ♦ Polymers ♦ Dielectrics and electrical insulation ♦ Plastic insulation ♦ Degradation
Abstract In order to reconstruct the 3D patterns of real electrical trees, we investigated the applicability of computerized tomography method (CTM) and the serial sectioning method (SSM). We also investigated the relationship between the fractal dimension of the reconstructed 3D patterns and that of projected 2D patterns of real electrical trees, from the point of view of fractal dimension. It was pointed out that it is important to estimate the fractal dimension of spatial patterns precisely and 3-dimensionally.
Description Author affiliation: Dept. of Electr. Eng., Meiji Univ., Kawasaki, Japan (Uehara, H.)
ISBN 0780342372
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1998-06-22
Publisher Place Sweden
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 351.92 kB
Page Count 4
Starting Page 309
Ending Page 312


Source: IEEE Xplore Digital Library