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Author Evangelidis, G.D. ♦ Psarakis, E.Z.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2007
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Special computer methods
Subject Keyword Photometry ♦ Iterative algorithms ♦ Nonlinear distortion ♦ Parameter estimation ♦ Closed-form solution ♦ Computer vision ♦ Robustness ♦ Nonlinear optics ♦ Optical distortion ♦ Optical sensors
Abstract The ability of an algorithm to accurately estimate the parameters of the geometric transformation which aligns two image profiles even in the presence of photometric distortions can be considered as a basic requirement in many computer vision applications. Projective transformations constitute a general class which includes as special cases the affine, as well as the metric subclasses of transformations. In this paper the applicability of a recently proposed iterative algorithm, which uses the Enhanced Correlation Coefficient as a performance criterion, in the projective image registration problem is investigated. The main theoretical results concerning the iterative algorithm and an efficient approximation that leads to an optimal closed form solution (per iteration) are presented. Furthermore, the performance of the iterative algorithm in the presence of nonlinear photometric distortions is compared against the leading Lucas-Kanade algorithm by performing numerous simulations. In all cases the proposed algorithm outperforms the Lucas-Kanade algorithm in convergence speed and robustness against photometric distortions under ideal and noisy conditions.
Description Author affiliation: Univ. of Patras, Patras (Evangelidis, G.D.; Psarakis, E.Z.)
ISBN 9780769530154
ISSN 10823409
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2007-10-29
Publisher Place Greece
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 392.08 kB
Page Count 7
Starting Page 522
Ending Page 528

Source: IEEE Xplore Digital Library