Access Restriction

Author Di Carlo, S. ♦ Miele, A. ♦ Prinetto, P. ♦ Trapanese, A.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2010
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Microprocessors ♦ Fault tolerance ♦ Field programmable gate arrays ♦ Hardware ♦ Circuit faults ♦ Fault tolerant systems ♦ Electrical fault detection ♦ Error correction ♦ Degradation ♦ Fault diagnosis ♦ graceful degradation ♦ fault tolerance ♦ partial reconfiguration ♦ self-repair architectures
Abstract This paper presents a novel approach to exploit FPGA dynamic partial reconfiguration to improve the fault tolerance of complex microprocessor-based systems, with no need to statically reserve area to host redundant components. The proposed method not only improves the survivability of the system by allowing the online replacement of defective key parts of the processor, but also provides performance graceful degradation by executing in software the tasks that were executed in hardware before a fault and the subsequent reconfiguration happened. The advantage of the proposed approach is that thanks to a hardware hypervisor, the CPU is totally unaware of the reconfiguration happening in real-time, and there's no dependency on the CPU to perform it. As proof of concept a design using this idea has been developed, using the LEON3 open-source processor, synthesized on a Virtex 4 FPGA.
Description Author affiliation: Politecnico di Torino, Dipartimento di Automatica e Informatica, I-10129, Torino, Italy (Di Carlo, S.; Miele, A.; Prinetto, P.; Trapanese, A.)
ISBN 9781424458349
ISSN 15301877
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2010-05-24
Publisher Place Czech Republic
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
e-ISBN 9781424458356
Size (in Bytes) 295.97 kB
Page Count 6
Starting Page 201
Ending Page 206

Source: IEEE Xplore Digital Library