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Author Wien Hong ♦ Chih-Wei Shiu ♦ Tung-Shou Chen
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Image quality ♦ Histograms ♦ histogram shifting technique ♦ Digital images ♦ Data encapsulation ♦ Educational institutions ♦ Reversible data hiding ♦ Information management ♦ Data mining ♦ Application software ♦ Intelligent systems ♦ Pixel
Abstract Reversible data hiding is a technique that embeds secret information into a host media without loss of host information. Ni et al.'s histogram shifting technique is a high-quality, reversible method for data embedding. However, their technique still suffers from undesirable distortion at low embedding rates and lack of a mechanism to control the stego-image quality, due to all pixels between the peak point and the minimum point have to be shifted one unit for data embedding. The proposed technique lowers the distortion performance at low embedding rates by scanning pixels from outer region toward the center of the host image, and chooses better locations for shifting histograms to embed data. The experimental results show that the proposed method significantly improves the quality of the stego image of histogram shifting technique, especially at low embedding rates.
Description Author affiliation: Dept. of Comput. Sci. & Inf. Technol., Nat. Taichung Inst. of Technol., Taichung (Tung-Shou Chen) || Dept. of Inf. Manage., Yu Da Coll. of Bus., Miaoli (Wien Hong; Chih-Wei Shiu)
ISBN 9780769533827
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-11-26
Publisher Place Taiwan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 324.44 kB
Page Count 5
Starting Page 183
Ending Page 187

Source: IEEE Xplore Digital Library