Access Restriction

Author Rajan, D. ♦ Yu, P.S.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2006
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Computer programming, programs & data
Subject Keyword Biological cells ♦ Data mining ♦ Chromosome mapping ♦ Cloning ♦ Frequency estimation ♦ Robustness ♦ Databases ♦ Humans ♦ Genomics ♦ Bioinformatics
Abstract We approach the problem of discovering interesting orders in data. In many applications, it is more important to find interesting partial orders since there is often no clear ordering between certain sets of elements. Furthermore, a partial order is more robust against partially erroneous data. We present the notion of fundamental partial orders (FPO), and argue that any partial order that satisfies this property is an interesting partial order. To mine such partial orders, we present a two-stage methodology that first finds an interesting total order, and then discovers a partial order satisfying FPO using this total order. To illustrate, we focus on {0,1} data. This is an important problem with many applications, e.g., in paleontology, where we chronologically order fossil sites by minimizing Lazarus counts. We present the experimental results of our method on paleontological data, and show that it outperforms existing approaches. The techniques developed here are general and can be abstracted for mining partial orders in any setting.
Description Author affiliation: IBM T. J. Watson Res. Center, Hawthorne, NY (Rajan, D.; Yu, P.S.)
ISBN 0769527017
ISSN 15504786
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2006-12-18
Publisher Place China
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 220.63 kB
Page Count 12
Starting Page 510
Ending Page 521

Source: IEEE Xplore Digital Library