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Author Alves, V.C. ♦ Antunes, A.R. ♦ Marzouki, M.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1996
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword System testing ♦ High level synthesis ♦ Automatic testing ♦ Design for testability ♦ Constraint optimization ♦ Design optimization ♦ Libraries ♦ Control system synthesis ♦ Network synthesis ♦ Built-in self-test
Abstract Starting from the analysis of the most widely adopted methodologies and the most successful industrial tools in the fields of HLS and DFT, this paper proposes a general framework for a pragmatic, systematic and flexible SFT methodology. The prerequisites for such a methodology, together with the state of the art are first assessed, then an overview of the approach is presented, followed by step-by-step details through a case-study of High-Level Synthesis For BIST. Examples of first obtained results are also provided.
Description Author affiliation: COPPE, Univ. Fed. do Rio de Janeiro, Brazil (Alves, V.C.)
ISBN 0818674784
ISSN 10857735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1996-11-20
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 661.45 kB
Page Count 6
Starting Page 263
Ending Page 268


Source: IEEE Xplore Digital Library