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Author Tsukizoe, A. ♦ Sakemi, J. ♦ Kozawa, T. ♦ Fukuda, H.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1983
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations
Subject Keyword Very large scale integration ♦ Design automation ♦ Laboratories ♦ Integrated circuit measurements ♦ Process design ♦ Libraries ♦ Algorithm design and analysis ♦ Assembly systems ♦ Operating systems ♦ Data handling
Abstract A fast checking algorithm and evaluation of a high-hitting pattern checker (MACH) for VLSI mask data are presented. A two-dimensional-limited searching algorithm has realized O(Nv), where Nv is the number of vectors. The processing speed of MACH is 6,000 vectors per second. MACH can handle VLSI data of more than 10,000,000 vectors that include diagonal vectors. The designer can describe arbitrary design rules using a Design Rule Description Language. We have defined two quality measures for a pattern checker, that is, Detecting Rate and Hitting Rate. MACH has achieved the best detecting rate of 100% and a high hitting rate of more than 80%.
Description Author affiliation: Central Research Laboratory, Hitachi Ltd., Tokyo, JAPAN (Tsukizoe, A.)
ISBN 0818600268
ISSN 0738100X
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1983-06-27
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 487.52 kB
Page Count 6
Starting Page 726
Ending Page 731


Source: IEEE Xplore Digital Library