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Author Huihui Bai ♦ Mengmeng Zhang ♦ Meiqin Liu ♦ Anhong Wang ♦ Yao Zhao
Sponsorship IEEE Signal Process. Soc.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Computer science, information & general works ♦ Data processing & computer science
Subject Keyword Image coding ♦ Correlation ♦ Feature extraction ♦ Educational institutions ♦ Interviews ♦ Roads ♦ Cameras ♦ image compression ♦ Multiview ♦ SIFT
Abstract In this paper, a novel scheme of two-stage multiview image compression is proposed to create two-level reconstructed quality. Differently from the conventional multiview image compression algorithms, SIFT (Scale-Invariant Feature Transform) features matching from interview images are exploited to remove the correlations between multiple views. In the first stage coding, SIFT and RANSAC (RANdom SAmple Consensus) algorithms are combined to calculate the correlation matrix of interview, which then can be developed to obtain the coarse reconstruction of the current view. In the second stage coding, the reconstructed quality can be improved further by using the residual information. The experimental results have shown that at higher compression ratio, the proposed scheme can obtain better rate-distortion performance than intra coding in MVC (Multiview Video Coding). Furthermore, with the change of the compression ratio, the proposed scheme can achieve more stable reconstructed quality.
Description Author affiliation: Beijing Jiaotong Univ., Beijing, China (Huihui Bai; Meiqin Liu; Yao Zhao) || North China Univ. of Technol., Beijing, China (Mengmeng Zhang) || Taiyuan Univ. of Sci. & Technol., Taiyuan, China (Anhong Wang)
ISBN 9781479938827
ISSN 10680314
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-03-26
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 93.84 kB
Page Count 1
Starting Page 398
Ending Page 398


Source: IEEE Xplore Digital Library