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Author Maeda, A.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2008
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Frequency ♦ Distortion measurement ♦ Harmonic distortion ♦ Attenuators ♦ Spectral analysis ♦ Degradation ♦ Circuit testing ♦ Linearity ♦ Sampling methods ♦ Bandwidth ♦ Harmonic Distortion ♦ AWG ♦ ATE Hardware ♦ THD ♦ ADC
Abstract A harmonic distortion test is often used to check the dynamic linearity of ADCs. As the state-of-the-art ADCs have faster sampling rates, wider bandwidths and higher resolution, the input sine wave typically generated by an Arbitrary Waveform Generator (AWG) in ATE must be higher frequency with very lower distortion. Since AWG's circuit is designed to have the flexibility in terms of wave shapes, frequency and amplitude, it is difficult to output a very low distortion sine wave. The purpose of this paper is to introduce some techniques to generate the very low distortion sine wave by an AWG except very well know techniques like using LPF that cut off frequency is close to the output frequency.
Description Author affiliation: Verigy Japan K.K., Hachioji (Maeda, A.)
ISBN 9780769533964
ISSN 10817735
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2008-11-24
Publisher Place Japan
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 336.68 kB
Page Count 1
Starting Page 147
Ending Page 147


Source: IEEE Xplore Digital Library