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Author Cherubal, S. ♦ Chatterjee, A.
Sponsorship IEEE Comput. Soc. Test Technol. Tech. Council
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2001
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Measurement techniques ♦ Sampling methods ♦ Time measurement ♦ Current measurement ♦ Timing jitter ♦ Phase detection ♦ Detectors ♦ Circuit testing ♦ Clocks ♦ Noise measurement
Abstract In this paper, we propose a new technique for jitter measurement that can be implemented using commercially available, off-the-shelf components. The technique implements a high-resolution, high-speed, phase detector using a high-speed Analog-to-Digital Converter (ADC). The technique is shown to have high resolution and low test time compared to currently available techniques. Experimental results to demonstrate the effectiveness of the technique are presented.
Description Author affiliation: ARDEXT Technol., Atlanta, GA, USA (Cherubal, S.)
ISBN 0780371690
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2001-11-01
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 775.75 kB
Page Count 10
Starting Page 838
Ending Page 847


Source: IEEE Xplore Digital Library