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Author Arai, M. ♦ Fukumoto, S. ♦ Iwasaki, K.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2005
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Error analysis ♦ Circuit testing ♦ Built-in self-test ♦ Convolutional codes ♦ Circuit faults ♦ Automatic testing ♦ Compaction ♦ Error correction codes ♦ Probability ♦ Costs
Abstract Convolutional compactors offer a promising technique of compacting test responses that include unknown values. One drawback of this compaction technique is error masking, i.e., some errors appearing in the test responses cannot be detected due to mutual cancellation. In this work, we theoretically analyze error-masking probability. First, we apply weight distributions of binary linear error-correcting codes to derive the error-masking probability. We then present a fast calculation scheme for 4- and 6-error-masking probabilities. Numerical examples reveal that they are about the same as those obtained by Monte-Carlo simulations. We also analyze X-masking probability, that is, the probability that an error is masked by unknown values. We present tree-search-based calculation, as well as approximated value
Description Author affiliation: Tokyo Metropolitan Univ. (Arai, M.; Fukumoto, S.; Iwasaki, K.)
ISBN 0780390385
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2005-11-08
Publisher Place USA
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 317.39 kB
Page Count 561
Starting Page 10
Ending Page 570


Source: IEEE Xplore Digital Library