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Author Wei-Cheng Lien ♦ Kuen-Jong Lee ♦ Chakrabarty, K. ♦ Tong-Yu Hsieh
Sponsorship IEEE Counc. Electron. Design Autom.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©2014
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Radiation detectors ♦ Compaction ♦ Circuit faults ♦ Multiplexing ♦ Registers ♦ Flip-flops ♦ Educational institutions
Abstract Output-bit selection is a recently proposed test-response compaction approach that can effectively deal with aliasing, unknown-value, and low-diagnosis problems. This approach has been implemented using a single counter and a multiplexer without considering unknown values. Also, such an implementation may require the application of a pattern multiple times in order to observe all selected responses. In this paper, we present a multiple-counter-based architecture with a new selection algorithm that can avoid most unknown-values yet achieve high compaction ratio. The remaining small number of unknowns can then be dealt with using some simple masking logic. Experiments on IWLS'05 circuits show that even with 16% unknown responses, all unknown values can be handled with 88.92%~93.21% response-volume reduction still achieved and only a moderate increase in test-application time.
Description Author affiliation: Dept. of Electr. Eng., Nat. Sun Yat-sen Univ., Kaohsiung, Taiwan (Tong-Yu Hsieh) || Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA (Chakrabarty, K.) || Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan (Wei-Cheng Lien; Kuen-Jong Lee)
ISBN 9781479934157
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 2014-05-26
Publisher Place Germany
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 298.09 kB
Page Count 6
Starting Page 1
Ending Page 6

Source: IEEE Xplore Digital Library