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Author Abramovici, M. ♦ Parikh, P.S.
Source IEEE Xplore Digital Library
Content type Text
Publisher Institute of Electrical and Electronics Engineers, Inc. (IEEE)
File Format PDF
Copyright Year ©1992
Language English
Subject Domain (in DDC) Technology ♦ Engineering & allied operations ♦ Applied physics
Subject Keyword Circuit faults ♦ Circuit testing ♦ Fault detection ♦ Electrical fault detection ♦ Sequential analysis ♦ System testing ♦ Probes ♦ Benchmark testing ♦ Design for testability ♦ Combinational circuits
ISBN 0780307607
ISSN 10893539
Educational Role Student ♦ Teacher
Age Range above 22 year
Educational Use Research ♦ Reading
Education Level UG and PG
Learning Resource Type Article
Publisher Date 1995-09-20
Publisher Place MD
Rights Holder Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Size (in Bytes) 553.96 kB


Source: IEEE Xplore Digital Library